• image of 逻辑 - 专用逻辑> SN74ABT18646PM
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SN74ABT18646PM
IC SCAN-TEST-DEV/TXRX 64-LQFP
-
Tray
7527
-
image of 逻辑 - 专用逻辑> SN74ABT18646PM
image of 逻辑 - 专用逻辑> SN74ABT18646PM
SN74ABT18646PM
SN74ABT18646PM
Logic - Specialty Logic
Texas Instruments
IC SCAN-TEST-DEV/TXRX 64-LQFP
-
Tray
7527
-
TYPEDESCRIPTION
MfrTexas Instruments
Series74ABT
PackageTray
Part StatusActive
Logic TypeScan Test Device With Transceivers And Registers
Supply Voltage4.5V ~ 5.5V
Number of Bits18
Operating Temperature-40°C ~ 85°C
Mounting TypeSurface Mount
Package / Case64-LQFP
Supplier Device Package64-LQFP (10x10)
Base Product Number74ABT18646
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